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Scanning Electron Microscope(EDSºÎÂø)
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TESCAN(Czech),VEGA ¥± LSU
X-RAY DIFFRACTOMETER
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Rigaku(Japan), Ultima¥³
Field Emission Scanning Electron Microscope
(Àü°è¹æ»çÇü ÁÖ»çÀüÀÚÇö¹Ì°æ)
TESCAN(Czech), MIRA 3 LMH In-Beam Detector
Cross-section & Planar milling system
(À̿ ¹Ð¸µ±â)
Gatan(USA), 697 Ilion II

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´ë¿¬Ä·ÆÛ½º : ºÎ»ê±¤¿ª½Ã ³²±¸ ¿ë¼Ò·Î 45 ´ë¿¬Ä·ÆÛ½º (¿ì:48513) / Tel. (051) 629-6891,6882 / Fax. (051) 629-6899
¿ë´çÄ·ÆÛ½º : ºÎ»ê±¤¿ª½Ã ³²±¸ ½Å¼±·Î 365 ¿ë´çÄ·ÆÛ½º (¿ì:48547) / Tel. (051) 629-5287 / Fax. (051) 629-5296
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